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X-ray Spectrometer (1-20keV) | SIMTRUM Photonics Store

Products / Light Analysis /Spectrometers /X-Ray/XUV/VUV Spectrometers (1-300nm) /X-ray Spectrometer (1- 20keV) /
X-ray Spectrometer (1- 20keV)
hardLIGHT Overview Related Product Order Now!

hardLIGHT X-ray Spectrometer (2 - 4keV)

The TXS spectrometer enables accurate photon diagnostics at HHG beamlines, X-ray 

free-electron lasers, and table-top X-ray lasers. Photon energies between 2 keV and 

4 keV can be measured in single-shot. In von Hamos geometry with high-efficiency 

backscattering, the X-ray spectrum is fingerprinted for online beam characterization. 

The transmitted beam remains undisturbed with >90% transmission for further use in 

experiments. By simply exchanging the backscattering probe with a material sample, 

the hardLIGHT TXS is made ready for X-ray emission spectroscopy (XES). The tender 

X-ray range provides sensitive access to the chemical state of many materials, e.g., 

investigations of sulfur at 2keV allow for important insights for battery research.

X-ray Spectrometer.JPG

Please check the table below for individual specifications

Product Brochure English: X-ray Spectrometer (1-20keV)

中文产品册: X-ray Spectrometer (1-20keV)


Typical Value

Remarks

Product Model

hardLIGHT TXS


Topology

Von Hamos


Energy Range (KeV)

2-4 keV , resolution 0.3eV


Source Distance

Flexible


Detector

CCD or MCP/CMOS or Hybrid


Operating Pressure (mbar)

< 10-6

UHV Version Available

Crystal Positioning

Motorized Closed-loop


Spectral Filter Insertion Unit

Optional


Control Interfaces

USB or Ethernet


Software

Windows UI and LabVIEW/VB/C/C++SDK


Customizable

Fully Customizable



Versatility

• Small footprint

• Easily transferred between experimental stations

• Intuitive operation


XES Operation Mode

• Emission spectroscopy in the tender X-ray range 2-4keV

• Integrated sample mount

• High energy resolution of 10-4 in a bandwidth of 2%


Diagnostic Operation Mode

• Online beam characterization at HHG beamlines, 

• X-ray free-electron lasers, 

• table-top X-ray lasers

• Non-interfering architecture with backscattering probe

• High transmission >90%





box.JPG

Customization

• Every spectrometer is customized to exactly match the desired 

  application, e.g:

• Table-top x-ray spectrometers

• Bragg/Laue x-ray spectrometer

• Combined crystal/multilayer spectrometer

• Tokamak diagnostics

• Monte Carlo simulations


hardlight.JPG



Related UV Camera Options

Product
Model

maxCAM

 easyCAM XF95
 Sensor

 back-illuminated CCD from e2v (grade 1),

 enhanced process, uncoated

front-illuminated CCD from e2v (grade 1), 

enhanced process

Back-illuminated sCMOS without Anti-reflection coating
Wavelength 1-100nm( Best QE) 50-300nm -
 Pixels  1024 x 255 * 2048 x 2048
 Pixel Size  26 x 26 um 11um x 11 um
 Image Area  26.7 x 6.7 mm 22.5mm x 22.5mm
 Spectral Rates  200/s full vertical bin, 1000/s crop mode 80-1000eV; 200 nm-1100nm
 Minimum Temperature  -60° C air cooled -50° C @20° C room temperature
 Well Depth

 500 000 e- active area,  1 000 000 eregister

90 000 e-
 Read Noise  12.5 etyp. at 500kHz 1.6 e- (Median)
 Dark Current  0.004 e- /px/s at -60°C -
 Linearity  >99% -
 Vacuum Compatibility  10-8mbar 10-7Pa(Max)

 

Related Spectrometer Product 

Product Model Wavelength (nm) Dispersion Resolution  
maxLIGHT Pro (XUV) 5 to 80 0.5 to   1.3nm/mm <0.028nm at 40nm
easyLIGHT (XUV) 30 to 250 ~2.0nm/mm <0.1nm
highLIGHT(XUV) 1 to 100 - <0.1nm
maxLIGHT (VUV) 40 to 200 0.9 to   1.6nm/mm <0.05nm at 120nm
easyLIGHT (VUV) 80 to  300 ~2.5nm/mm <0.1nm
X-Ray Spectroscopy 
 2-4 keV   0.3eV
Extended X-ray Spectroscopy 5-12keV    
Near Edge X-ray absorption 
 200 - 1200eV
    

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