Temperature Control System

Features

● Temperature control accuracy: ±0.1 ℃

● Supports transmissive/reflective mode

● Compact structure, suitable for various variable 

   temperature tests

● Wide temperature range: -190 to 600℃ / Room 

   Temperature to 1200

● Gas-tight chamber design, can flow protective gas

● Upgradeable vacuum chamber design, 10^-5mbar

● The optical windows can be replaced for different 

   materials

● Can be replaced with different types of optical interfaces

● PC software control supports modification or 

   customization

Gas-tight 

Optical temperature control stage

Protective gas can be passed through 

Vacuum 

Optical temperature control stage

Mechanical pumps up to 10^-3mbar

Molecular pump up to 10^-5mbar

1 ) Sample stage material: silver (medium and low temperature), ceramic (high temperature)

2 ) Sample stage size: 23x23mm (can be customized)

3 ) Light transmission hole: 2mm (can be customized)

4 ) Window material: optical glass, sapphire, calcium fluoride etc.

5 ) Window size: φ 25mm (can be customized)

Sample / Window Defrosting

Sample Defrosting Method                                    

a. Flow protective gas,   b. Vacuum                                    

Window Defrosting

Nitrogen purges the window glass.

Water circulating system

(temperature control)

The water circulation system is needed for Ultra-low or High-temperature environments. It attaches to the Temperature stage chamber

●  For low temperatures application down to -190 degrees it will prevent water condensation to the stage and chamber

●  For high-Temperature application it will cool the chamber wall to room temperature for safety 

Temperature

Stability

Fixed Slope

Heating

Programmable Block Ramp 

Up & Down

Heating and cooling speed (control) 0 - 30 ℃/min (recommended), maximum 60 ℃/min

Real System Setup

Materials Light Absorption Analysis

at Different Temperatures 

Large NA High Sensitivity 

          Spectrometer

Infrared Transmission Spectrometer with 

Hot & Cold Stretching

Temperature Change Test of 

Semiconductor Material