Scanning Slit Beam Profiler (190-2500nm)

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Products / Light Analysis /Laser Beam Profilers /Scanning Slit Beam Profiler /

Scanning Slit Beam Profiler

BeamMap2 – XYZΘΦ Beam'R2 – XY Related Products Order Now!

Product Brochure: BeamMap2 - XYZΘΦ | Selection Guide

Features

· 190 to 1150 nm, Silicon detector

· 650 to 1800 nm, InGaAs detector

· 1000 to 2300 or 2500 nm, InGaAs (extended) detector

· Multiple plane spacing options available

· Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*

· Port-powered USB 2.0; flexible 3 m cable; no power brick

· 0.1 µm sampling and resolution

· Linear & log X-Y profiles, centroid

· Profile zoom & slit width compensation

· Real-time multiple Z plane scanning slit system

· Real-time XYZ profiles, Focus position

· Real-time M², Divergence, Collimation, Alignment

Applications

· Laser printing & marking

· Medical lasers

· Diode laser systems

· Fiber optic telcom assembly focusing – LensPlate2™ option for re-imaging

waveguides and fiber ends

· Development, production, field service

· CW; Pulsed lasers, Φ µm ≥ [500/(PRR in kHz)]

· M² measurement with available M2DU stage

Specifications

Parameters	Details
Wavelength	Si detector: 190 to 1150 nm
	InGaAs detector: 650 to 1800 nm
	Si + InGaAs detectors: 190 to 1800 nm
	Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Scanned Beam Diameters	Si detector: 5 µm to 4 mm, to 2 µm in Knife-Edge mode*
	InGaAs detector: 10 µm to 3 mm, to 2 µm in Knife-Edge mode*
	InGaAs (extended) detector: 10 µm to 2 mm, to 2 µm in Knife-Edge mode*
Plane Spacing (4XY models)	100 µm: -100, 0, +100, +400 µm
	250 µm: -250, 0, +250, +1000 µm
	500 µm: -500, 0, +500, +2000 µm
	750 µm: -750, 0, +750, +3000 µm
Plane Spacing (3XYKE models)	50 µm: -50, 0, +50, 0 µm
Plane Spacing (3XYKE models)	100 µm: -100, 0, +100, 0 µm
Beam Waist Diameter Measurement	Second moment (4s) diameter to ISO 11146; Fitted Gaussian & TopHat
	1/e² (13.5%) width
	User selectable % of peak
	Knife-Edge mode* for very small beams
Beam Waist Position Measurement	± 20 µm best in X, Y, and Z — contact DataRay for recommendation
Measured Sources	CW; Pulsed lasers, F µm = [500/(PRR in kHz)]
Resolution Accuracy	0.1 µm or 0.05% of scan range
Resolution Accuracy	± < 2% ± = 0.5 µm
M² Measurement	1 to > 20, ± 5%
Divergence/Collimation, Pointing	1 mrad best — contact DataRay for recommendation
Maximum Power & Irradiance	1 W Total & 0.5 mW/µm²
Gain Range	1,000:1 Switched 4,096:1 ADC range
Displayed Graphics	X-Y-Z Position & Profiles, Zoom x1 to x16
Update Rate	~5 Hz
Pass/Fail Display	On-screen selectable Pass/Fail colors. Ideal for QA & Production.
Averaging	User selectable running average (1 to 8 samples)
Statistics	Min., Max., Mean, Standard Deviation
Statistics	Log data over extended periods
XY Profile & Centroid	Beam Wander display and logging
Minimum PC Requirements	Windows, 2 GB RAM, USB 2.0/3.0 port

BeamMap2 Laser Beam Profiler

Product Brochure: Beam'R2 -XY | Selection Guide