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NEW Product
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Laser Diode and LED Testing System are measurement systems for the electro-optical characterization of laser diodes and LEDs, whether packaged or in bare chip form. These instruments perform complete LIV measurements in extremely short time for high throughput by using pulse testing method, QCW and CW testing including burn-in.
Product Brochures:Laser Diode Test System | Laser Diode Test System LIV120 | Laser Diode Test System LIV120
Laser Diode Characterization System LIV100
(Pulse Testing Only)
Maximum currents: 250mA up to 600A
Maximum number of current steps: 4000
Interface: USB
Rise time: 50ns (F-version); 500ns (L-version); 1us (XL-version)
Throughput: Typically 1s per device
Rise time: 50ns; 500ns; 1us
Laser Diode Characterization System LIV120
(Pulsed, QCW and CW testing including burn-in)
Maximum currents: 250mA up to 1200A
Rise Time: 5us
LIV 100
LIV 120
LIV120-250 up to LIV120- 2500
Wall plug
LIV100
The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).
-LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. The longest pulse length at maximum current is typically limited to 10µs.
-LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs. The longest pulse length at maximum current is typically limited to 100µs.
-LIV100-XLxxx: extra-long pulse version with rise time of 1µs. The shortest pulse duration is 5µs. The longest pulse length at maximum current is 2000µs.
Principles Of Operation
All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput. The LIV100 operates in pulsed mode only:
Pulse LIV Mode
The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:
Pulsed Burst Mode
The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom strip line or contact card configuration service.
LIV120
-Diode characterization
-Quality control of incoming goods
-OEM
We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures. The current ranges 250mA to 2A are forced air cooled. Above 2A in the compact enclosure, the unit is liquid cooled. Please contact us if liquid cooling is required for the low current versions. The LIV120 uses our extensive range of OPM150 laser power detector heads with all of the comfort of intelligent head technology for cost efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers. The measurement cycle typically takes less than 1s including the data transfer to the host computer.
A complete parameter set for a given measurement protocol may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. The LIV120 operates both in CW and pulsed modes:
CW-LIV Mode
Pulsed LIV Mode
Many laser diodes of the same type may now be tested in this manner with very high throughput. The LIV120 can run in the so-called soft pulse mode. This means that the current between pulses in pulsed mode operation does not drop down to zero, but rather to the value of the minimum current set by the operator. Note the very clean, square shape of the current pulses.
The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. All parameters (power, currents and voltage) are measured in this mode. Schematically this appears as follows:
CW-Burst Mode
The burst mode is useful for lifetime testing, checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom connection line or contact card configuration service.
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Light Analysis
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