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LIV Test Systems for Laser Diode / LED | SIMTRUM Photonics

LIV Test Systems for Laser Diode / LED

Laser Diode and LED Testing System are measurement systems for the electro-optical characterization of laser diodes and LEDs, whether packaged or in bare chip form. These instruments perform complete LIV measurements in extremely short time for high throughput by using pulse testing method, QCW and CW testing including burn-in.


Product Brochures:Laser Diode Test System | Laser Diode Test System LIV120Laser Diode Test System LIV120


Laser Diode Characterization System LIV100

 (Pulse Testing Only)


Maximum currents:  250mA up to 600A

Maximum number of current steps: 4000

Interface:  USB

Rise time: 50ns (F-version); 500ns (L-version); 1us (XL-version)

Throughput:  Typically 1s per device

Rise time:  50ns;  500ns;  1us

image.png

 Laser Diode Characterization System LIV120

 (Pulsed, QCW and CW testing including burn-in)


Maximum currents:  250mA up to 1200A

Maximum number of current steps:  4000

Interface:  USB

Throughput:  Typically 1s per device

Rise Time: 5us

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LIV 100

PARAMETER CONDITIONS RESOLUTION MIN TYP MAX UNITS
 INPUT
Sampling rate selectable: 20/n MS/s with n = 1 .. 20 n.a. 1 1 20 MS/s
A/D resolution       13   bit
Photodiode gain optimum gain, automatically selected     110   V/mA
Transimpedance amplifier rise time       70    ns
 OUTPUT
Pulse duration F 0.05 0.15   2000 µs
L 0.05 2   2000
XL 0.05 10   2000
Rise time at maximum current F     70 100 ns
L     420 500
XL     700 1000
Current overshoot at max current     0 3   %
Pulse separation   50 100   500000 µs
Current range((examples only: any current rangefrom 0.5A to 600A may be specifiedat time of purchase)) 2A max 0.0005 0.01   2 A
40 0.01 0.2   40
200 0.05 1   200
600 0.15 2   600
D/A resolution       12   bit
Compliance voltage       8 20 V
Duty cycle
(examples only: any current rangefrom 0.5A to 600A may be specifiedat time of purchase)
Fast rise time version: LIV100-F002, LIV100-F040, LIV100-F120       25, 1.5, 0.5 %
Extra long pulse version:LIV100-XL002, LIV100-XL040, LIV100-XL200       50, 3, 0.6 %
 SIGNAL PROCESSING
Depth of storage       512    kB
Number of cycles for averaging   1 1   250  
PC INTERFACE
Type     USB; 100kB/s
 DIMENSIONS
  DAQ unit   114 x 150 x 125 mm (W x L x H) mm
  with mounting plate   165 x 150 x 135 mm (W x L x H) mm

LIV 120

Parameter Device type Conditions Min Typ Max Unit
 Input
Maximum power Depending on the selected integrating sphere and detector head.
See OPM150 series for details!
Monitor diode current LIV120-250
LIV120-500
LIV120- 1000
LIV120-2500
LIV120-5000
gain 0
gain 1
gain 2
0.0025
0.00025
0.025
  10
1
100
mA
mA
µA
Monitor diode current LIV120-10A or higher   No measurement of monitor diode current
 Output
Laser diode current LIV120- 250
LIV120- 500
LIV120- 1000
 LIV120- 2500
 LIV120- 5000
  0.0625
0.125
0.250
0.625
1.250
  250
500
1000
2500
5000
mA
mA
mA
mA
mA
LIV120- 10A
LIV120- 20A
LIV120- 40A
  0.0025
0.005
0.01
  10
20
40
A
A
A
LIV120- L100A
LIV120- L200A
LIV120- L400A
LIV120- L800A
LIV120- L1200A
  0.025
0.05
0.1
0.2
0.3
  100
200
400
800
1200
A
Compliance voltage LIV120-250 up to-5000   6     V
LIV120-10A up to -40A   8     V
LIV120-100A
up to-1200A
         
Rise time at full
rated current

LIV120-250 up
to-5000
    2 5 µs
LIV120-
10A up to -40A
    6 10 µs
LIV120-100A
up to-1200A
    400 500 µs
Pulse duration

LIV120-250 up to-5000 pulse modes
CW modes
0.1
0.1
  60000
120000
ms
LIV120-10A up to -40A Pulse modes
CW modes
0.22
0.22
  60000
120000
ms
LIV120- 100A up to-1200A Pulse modes
CW modes
1
1
  60000
120000
ms
Duty cycle   Pulse modes
CW modes
0.0002
0.0002
  99.99
100
%
%
Measurement time     200     µs
        11 Tage
Number of measurements per channel LIV modes Burst modes          
LIV120-250 up to-5000   Channel:4
optical power
laser current
laservoltage
photo diode current
LIV120-10A up to-1200A   Channel:3
optical power
laser current
laservoltage
 In general
Power supply

LIV120-250 up to
LIV120- 2500

 

Wall plug

LIV120-5A up to
LIV120 - 40A
  table top power supply
LIV12 -100A   90   265 V
(single phase)
LIV120- 200A up to
-1200A
  342   528 V
(three- phase)
Communication USB2.0
Dimensions

LIV120-250 up to-1000   130 x 120 x65 (WxLx H) mm
LIV120- 2500 up to-40A   130 x 120 x106 (WxLx H) mm
LIV120 -100A   19″ Rack 3U  
LIV120- 200A up to-400A   19″ Rack 4U  
LIV120 -800A   19″ Rack 2 x 4U  
LIV120- 1200A   19″ Rack 3 x U  

 


LIV100 

The LIV100 is a short pulse test system for the characterization of laser diodes and LEDs at the chip, bar or submount level. The fast rise time with essentially no overshoot allows testing these thermally “naked” devices without undue thermal loading. The standard instruments are not capable of CW testing. We offer three versions of the LIV100 differing in speed and pulse length. Each version is available in any given maximum current (denoted by “xxx” in the list below).

-LIV100-Fxxx: fast version with 50ns rise time and pulse durations from 150ns. The longest pulse length at maximum current is typically limited to 10µs.

-LIV100-Lxxx: long pulse version with rise time of 500ns. The shortest pulse duration is 2µs. The longest pulse length at maximum current is typically limited to 100µs.

-LIV100-XLxxx: extra-long pulse version with rise time of 1µs. The shortest pulse duration is 5µs. The longest pulse length at maximum current is 2000µs.


Principles Of Operation

All three systems are controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIVs then perform the complete measurement sequence fully autonomously. The fast data acquisition provides for high throughput. The LIV100 operates in pulsed mode only: 


image.png


Pulse LIV Mode

The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. The laser power is measured for each pulse in this mode. Schematically this appears as follows:


image.png


Pulsed Burst Mode

The burst mode is useful for checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom strip line or contact card configuration service.





LIV120

The LIV120 is a powerful but low cost pulsed / QCW / CW test system for use in the lab as well as for OEM applications, ideal for

-Diode characterization

-Quality control of incoming goods

-OEM

We offer this instrument with a variety of end stages covering current ranges from 250mA up to 20A in a compact enclosure and up to 1200A in 19” rack enclosures. The current ranges 250mA to 2A are forced air cooled. Above 2A in the compact enclosure, the unit is liquid cooled. Please contact us if liquid cooling is required for the low current versions. The LIV120 uses our extensive range of OPM150 laser power detector heads with all of the comfort of intelligent head technology for cost efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers. The measurement cycle typically takes less than 1s including the data transfer to the host computer.


Principles Of Operation

A complete parameter set for a given measurement protocol may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. The LIV120 operates both in CW and pulsed modes: 


image.png


CW-LIV Mode

image.png


Pulsed LIV Mode

Many laser diodes of the same type may now be tested in this manner with very high throughput. The LIV120 can run in the so-called soft pulse mode. This means that the current between pulses in pulsed mode operation does not drop down to zero, but rather to the value of the minimum current set by the operator. Note the very clean, square shape of the current pulses.


image.png


The burst mode is used to run the driver at constant current with a single pulse (or step) width and pulse separation during the whole burst. All parameters (power, currents and voltage) are measured in this mode. Schematically this appears as follows:


image.png


CW-Burst Mode


image.png

Pulsed Burst Mode


The burst mode is useful for lifetime testing, checking the thermal contact on a device or for generating light for a certain length of time for other measurements such as smile, near field / far field patterns or spectra. Artifex Engineering supports this product with a custom connection line or contact card configuration service.





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