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Separate THz time domain spectrometer | SIMTRUM Photonics Store

Separate THz time domain spectrometer
SIMTRUM'S separated terahertz time-domain spectrometer offers a diverse range of measurement modes, providing a high degree of customization. Users can configure the corresponding scanning and probe modules based on their specific requirements. Notably, the separated model features an external display screen, whereas the compact model incorporates an embedded display. Non-destructive testing utilizing a high-speed delay line and a normal-incidence reflection probe.

 

Features

  • Wide spectrum range
  • High resolution
  • High detection speed
  • Innovative ATR mode
  • Compact structure
  • Low water vapor interference
  • Can be customized
  • Support AI software secondary development
 

 

ATR mode

Attenuated total reflection (ATR) technology is used to make terahertz waves fully reflected on the surface of the silicon prism, and at the total reflection point, the evanescent wave interacts with the sample, making the incident terahertz waves attenuated. By detecting the reflected terahertz waves, The optical parameters (absorption coefficient, refractive index and complex dielectric constant) of the sample in the terahertz range can be obtained.


 

Applications

 
Identification of isomers

 

Identification and theoretical simulation of different crystal forms

 

Identification of isomers

 

Nondestructive testing


Product Specifications

Sample type Dielectric materials like solid, powder, and liquid / nonmetallic materials
Major function measurement pattern There are many measurement modes of transmission, normal incident reflection, angular reflection and attenuated total reflection (ATR). With the scanning platform, it can realize the function of spectrum formation, imaging and atlas display.
Spectral line type Time domain spectrum, frequency domain spectrum, absorption spectrum, refractive index spectrum, permittivity spectrum
Imaging mode Time-domain imaging, frequency domain imaging, absorption imaging, maximum / minimum time-of-flight imaging, maximum / minimum peak imaging, peak peak imaging
Spectral / image processing algorithm Provide three-bit tomographic algorithm package, can be customized classification, target detection, quantitative analysis algorithm package
Performance index Spectrum range 0.1-5 THz
Spectrum resolution Better than 5 GHz (measured water vapor absorption spectrum resolution)
scanning scope ≥500 ps
dynamic range Better than 90 dB
Detection speed ≥24 Hz@67 ps、≥18 Hz@134 ps、≥10 Hz@330 ps
Navar AI atlas analysis edge computer, Ubuntu system, Python SDK
appendix Mechanical arm, Three-bit scan table, probe modules
service environment Temperature range: 10~30℃; relative humidity: 80%
 
Dimension

Sales Guide

Items Detail Unit Remark
1. What is the application?      
2. Determine whether to configure the fs laser?     fs laser is the standard configuration of THz-TDS, the shorter the laser pulse, the higher the time resolution of the system time
3. Repetition rate of laser?     The laser frequency range is usually tens of thousands of Hz to hundreds of thousands of Hz, the higher the repetition frequency, the faster the data acquisition speed, but it will introduce noise
4. What frequency range is required? 0.1-5 THz  
5. What spectral resolution is required? 5 GHz  
6. Requirements for detection speed?     ≥24 Hz@67 ps、≥18 Hz@134 ps、≥10 Hz@330 ps
7. Which measurement mode is required?     Three measurement modes of transmission, reflection and attenuated total reflection can be provided
8. According to the measurement mode, the corresponding measurement probe is equipped     Transmission, reflection, attenuation total reflection(ATR) measurement probe is optional
9. Reflection Angle requirement of reflection probe?     Probes with three reflection angles of 15°/20°/45° are available
10. Check whether the scan module needs to be configured?      

 

Working Principle

The working principle of THZ-TDS can be divided into two main parts: excitation (producing THz pulses) and detection (measuring THz pulses). The entire process is based on ultrafast laser pulse technology and usually involves the following steps:

 

1. Excitation (generate THz pulse)

Laser source: The THz-TDS system uses ultrafast laser pulses (usually femtosecond laser pulses) as the excitation source.

Photoelectric effect: When a laser pulse is irradiated onto a semiconductor material such as germanium (Ge), germanium phosphide (GaAs) or gallium arsenide (InGaAs), the photoelectric effect is excited. The laser pulse causes electrons in the semiconductor material to be excited, resulting in a brief pulse of electric current (THz radiation).

THz wave generation: This current pulse generates THz waves (THz radiation) through acceleration inside the material. Due to the broad spectrum nature of the laser pulse, these THz waves usually contain broadband information from low to high frequency, so they can provide comprehensive frequency information for subsequent spectral analysis.

 

2. Detection (measuring THz pulse)

Detectors: THZ-TDS utilizes photodetectors (usually also photodiodes based on materials such as GaAs, InGaAs, etc.) to detect electrical signals caused by THz radiation. When the detector receives the THz pulse, it can generate the corresponding electrical signal.

Electric field sampling: The detector usually measures the change in the electric field of the THz pulse when it is received. In order to obtain the complete THz waveform in time domain, the system captures the amplitude and phase information of THz wave by precisely controlling the time delay between the detection pulse and the excitation pulse, so as to realize the complete time domain measurement of THz wave.

 

3. Data processing

Fourier Transform: By obtaining the complete waveform of the THz wave in the time domain, the THZ-TDS system uses Fourier Transform to convert the time domain signal into the frequency domain signal. At this time, the resulting spectrum contains the frequency component of the THz wave, which can provide detailed spectral characteristics of the material or substance in this frequency band.

Analysis and interpretation: The absorption characteristics, refractive index, optical constant and other information of the material can be extracted from the frequency domain spectrum. Thus, THz-TDS can be used to study the electromagnetic properties of materials (e.g., dielectric constant, optical transmission properties, etc.).


 

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Search Reset
Compare Model Drawings & Specs Availability Reference Price
(USD)
LA-HT01-TDS-SEP
Spectrum range: 0.1-5 THz; Spectral resolution: Better than 5 GHz; Scanning range: ≥500 ps; Dynamic range: better than 90 dB; Detection speed: ≥24 Hz@67 ps/≥18 Hz@134 ps/≥10 Hz@330 ps
4~6 weeks $76082.17

Short-stroke 3D scanning displacement table TA-SS1 - Parameter

Long-stroke 3D scanning displacement table TA-SL1 - Parameter

Cylindrical scanning rotary displacement table TA-SR1 - Parameter

Robotic arm universal sampling module TA-SMA1 - Parameter

THz Multi-function measuring probe TA-CRA - Parameter

THz rotary disk measuring probe TA-CP-23-180 - Parameter

THz Integrated measuring probe TA-JC-100 - Parameter

THz small Angle incidence reflection measurement probe TA-RP15 - Parameter

THz transmission measuring probe TA-TP180 - Parameter

LA-HT01-TDS-SEP - Parameter

Short-stroke 3D scanning displacement table TA-SS1 - Download

Long-stroke 3D scanning displacement table TA-SL1 - Download

Cylindrical scanning rotary displacement table TA-SR1 - Download

Robotic arm universal sampling module TA-SMA1 - Download

THz Multi-function measuring probe TA-CRA - Download

THz rotary disk measuring probe TA-CP-23-180 - Download

THz Integrated measuring probe TA-JC-100 - Download

THz small Angle incidence reflection measurement probe TA-RP15 - Download

THz transmission measuring probe TA-TP180 - Download

LA-HT01-TDS-SEP - Download

Accessories

Compare Model Drawings & Specs Availability Reference Price
(USD)
THz transmission measuring probe TA-TP180
Measurement mode: transmission spectrum, transmission imaging
4~6 weeks $3603.89
THz small Angle incidence reflection measurement probe TA-RP15
Measurement mode: reflection spectrum, reflection imaging; Reflection Angle: The Angle between incident beam and sample normal is 7.5°; Focal length: 101.6 mm
4~6 weeks $3003.24
THz Integrated measuring probe TA-JC-100
Measurement mode: angle measurement, measurable spectrum, imaging; Focal length: 50.8/101 mm
4~6 weeks $6006.49
THz rotary disk measuring probe TA-CP-23-180
Measurement mode: angle measurement, measurable spectrum, imaging; Measuring angle: 23 ° -180 °
4~6 weeks $7207.78
THz Multi-function measuring probe TA-CRA
Measurement mode: angle measurement, measurable spectrum, imaging; Focal length: 50.8/101
4~6 weeks $10010.81
Robotic arm universal sampling module TA-SMA1
Mechanical arm payload: 15KG; Working radius: 900mm; Repeated positioning accuracy: 0.05mm
4~6 weeks $3003.24
Cylindrical scanning rotary displacement table TA-SR1
0-360 ° uninterrupted rotation ;Sample table maximum load: 20KG
4~6 weeks $5606.05
Long-stroke 3D scanning displacement table TA-SL1
X and Y axis displacement stages are used for sample scanning, and Z axis displacement stages are used for probe focusing
4~6 weeks $8008.65
Short-stroke 3D scanning displacement table TA-SS1
Imaging range: ≥ 100mm * 100mm; Scan step: 10 um; Repeat positioning accuracy: < 5 um; Sample table height adjustment range: ≥ 10mm; Working mode: movement to the specified position, linkage, jog
4~6 weeks $5606.05