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THz 3D tomographic detector | SIMTRUM Photonics Store

THz 3D tomographic detector

SIMTRUM'S Terahertz 3D tomography detector uses time-of-flight technology to realize non-destructive detection of dielectric / non-metallic materials and obtain three-dimensional recovery images of objects. The height and levelness of the sample table of the detector can be adjusted to achieve the best focusing of the detection surface. Corresponding scanning module and probe module can be customized according to the user requirements. At the same time, it is equipped with professional analysis software package to support substance detection and analysis and a variety of imaging methods. 

 

Features

  • Simultaneous detection of graph and spectrum
  • High degree of customization
  • High detection speed
  • Support AI software secondary development
 
Applications
 
Nondestructive testing
Wind power blade defects can only be nondestructive testing
 
3D restoration of high voltage cables
 
Nondestructive testing of composite defects
   

Product Specifications

Sample type Dielectric materials / nonmetallic materials
Major function measurement pattern Positive incident reflection, Angle reflection measurement mode. With the scanning platform, it can realize the function of spectrum formation, imaging, and spectrum integrated display function.
Imaging mode Time-domain imaging, frequency domain imaging, absorption imaging, maximum / minimum time-of-flight imaging, maximum / minimum peak imaging, peak peak imaging
Image processing algorithm We offer three dimensional tomography algorithm packages that can be customized for classification and target detection.
Performance index scanning scope ≥500 ps
dynamic range Better than 90 dB
Detection speed ≥24 Hz@67 ps、≥18 Hz@134 ps、≥10 Hz@330 ps
Imaging range Maximum of 500mm * 500mm
Imaging resolution ± 30 μ m (depth direction); 1mm (surface)
step size 50μm
Repeat positioning accuracy ≤20μm
Samrange of adjustment range The height can be adjusted with a range of 10 mm;
Navar AI atlas analysis edge computer, Ubuntu system, Python SDK
Appendix Probe module
Service environment Temperature range: 10~30℃; Relative humidity: 80%

 

Dimension

Sales Guide

Items Detail Unit Remark
1. What is the application?      
2. Determine whether to configure the fs laser?     fs laser is the standard configuration of THz-TDS, the shorter the laser pulse, the higher the time resolution of the system time
3. Repetition rate of laser?     The laser frequency range is usually tens of thousands of Hz to hundreds of thousands of Hz, the higher the repetition frequency, the faster the data acquisition speed, but it will introduce noise
4. What frequency range is required? 0.1-5 THz  
5. What spectral resolution is required? 5 GHz  
6. Requirements for detection speed?     ≥24 Hz@67 ps、≥18 Hz@134 ps、≥10 Hz@330 ps
7. Which measurement mode is required?     Three measurement modes of transmission, reflection and attenuated total reflection can be provided
8. According to the measurement mode, the corresponding measurement probe is equipped     Transmission, reflection, attenuation total reflection(ATR) measurement probe is optional
9. Reflection Angle requirement of reflection probe?     Probes with three reflection angles of 15°/20°/45° are available
10. Check whether the scan module needs to be configured?      

 

Working Principle

The working principle of THZ-TDS can be divided into two main parts: excitation (producing THz pulses) and detection (measuring THz pulses). The entire process is based on ultrafast laser pulse technology and usually involves the following steps:

 

1. Excitation (generate THz pulse)

Laser source: The THz-TDS system uses ultrafast laser pulses (usually femtosecond laser pulses) as the excitation source.

Photoelectric effect: When a laser pulse is irradiated onto a semiconductor material such as germanium (Ge), germanium phosphide (GaAs) or gallium arsenide (InGaAs), the photoelectric effect is excited. The laser pulse causes electrons in the semiconductor material to be excited, resulting in a brief pulse of electric current (THz radiation).

THz wave generation: This current pulse generates THz waves (THz radiation) through acceleration inside the material. Due to the broad spectrum nature of the laser pulse, these THz waves usually contain broadband information from low to high frequency, so they can provide comprehensive frequency information for subsequent spectral analysis.

 

2. Detection (measuring THz pulse)

Detectors: THZ-TDS utilizes photodetectors (usually also photodiodes based on materials such as GaAs, InGaAs, etc.) to detect electrical signals caused by THz radiation. When the detector receives the THz pulse, it can generate the corresponding electrical signal.

Electric field sampling: The detector usually measures the change in the electric field of the THz pulse when it is received. In order to obtain the complete THz waveform in time domain, the system captures the amplitude and phase information of THz wave by precisely controlling the time delay between the detection pulse and the excitation pulse, so as to realize the complete time domain measurement of THz wave.

 

3. Data processing

Fourier Transform: By obtaining the complete waveform of the THz wave in the time domain, the THZ-TDS system uses Fourier Transform to convert the time domain signal into the frequency domain signal. At this time, the resulting spectrum contains the frequency component of the THz wave, which can provide detailed spectral characteristics of the material or substance in this frequency band.

Analysis and interpretation: The absorption characteristics, refractive index, optical constant and other information of the material can be extracted from the frequency domain spectrum. Thus, THz-TDS can be used to study the electromagnetic properties of materials (e.g., dielectric constant, optical transmission properties, etc.).


 

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Compare Model Drawings & Specs Availability Reference Price
(USD)
LA-HT01-SCA-3D
Scanning range: ≥500 ps; Dynamic range: better than 90 dB; Detection speed: ≥24 Hz@67 ps/≥18 Hz@134 ps/≥10 Hz@330 ps; Imaging range: 500*500 mm^2 Max; Imaging resolution: ± 30μm (depth direction); 1mm (surface); Scanning step: 50μm; Repeated positioning accuracy: ≤ 20μm; Sample table adjustment range: height adjustment range: ≥10 mm; Levelness is adjustable
4~6 weeks $74613.92

THz small Angle incidence reflection measurement probe TA-RP15 - Parameter

THz vertical incidence probe TA-RP90 - Parameter

LA-HT01-SCA-3D - Parameter

THz small Angle incidence reflection measurement probe TA-RP15 - Download

THz vertical incidence probe TA-RP90 - Download

LA-HT01-SCA-3D - Download

Accessories

Compare Model Drawings & Specs Availability Reference Price
(USD)
THz vertical incidence probe TA-RP90
Measurement modes: reflection spectrum, reflection imaging
4~6 weeks $5005.41
THz small Angle incidence reflection measurement probe TA-RP15
Measurement modes: reflection spectrum, reflection imaging; Reflection angle: incident ray beam and sample normal angle 7.5 °; Focal length: 101.6mm
4~6 weeks $2002.16