VUV Spectrometers (80-300nm) | SIMTRUM Photonics Store

 VUV Spectrometer Specification Comparison

Product Brochures English：maxLIGHT pro  | easyLIGHT vuv

中文产品册：maxLIGHT pro | easyLIGHT vuv 

Advantge of Slit-less Technology in VUV Spectrometer 

Direct imaging of the source In contrast to conventional devices the innovative XUV / VUV spectrometers by HP do not require a narrow  entrance aperture but rather image the harmonic source directly onto the detector. Thus 80% or more of the incoming beam can be used for measurement. This configuration typically collects 15 to 25 times more light  than standard versions, resulting in a signal-to-noise figure improved by the same ratio. In some experiments,  this improved signal strength is the crucial step for realizing a measurement at all.

Superior signal strength

The amount of light collected by the spectrometer is the key factor influencing its overall sensitivity and ultimately the most important feature required to obtain high 

quality data even from weak sources. Conventional spectrometers use an entrance aperture (slit) at a fixed distance from the grating to create a small source which 

is then dispersed and imaged onto the detector. In contrast to that the H+P spectrographs can be configured to directly image a radiation source positioned at any 

distance from the grating onto the detector. In practice this allows for the collection of 15 to 25 times as much light from point-like radiation sources compared to a 

conventional spectrometer with a 100µm entrance slit without degradation in spectral resolution.

Rugged design

The compact design of our XUV and VUV spectrometers makes them inherently insensitive against mechanical and environmental disturbances (vibrations, acoustics, 

etc). No moving parts on the outside and closed-loop motors with absolute position monitoring inside the instrument add to the robustness and allow for monitoring of 

the grating alignment at all times. The spectrometer can be bolted directly to a vacuum chamber and is capable of carrying its own weight. No table required. The 

design also allows mounting in virtually any orientation.

Robust against misalignment

Owing to the rugged design even smaller bumps do not influence the instruments alignment. If the instrument is knocked heavily while the motor control is enabled, the 

grating can be repositioned to the saved setting using the grating positioning motors. In addition the concept of a spectrometer without entrance slit also makes the 

instrument less sensitive to misalignment. Under typical operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer 

by 500um would lead to a signal reduction by more than 20% in an instrument with entrance slit, while it is less than 10% for our design.

Flat-field imaging technology All our spectrometers are based on high quality aberration-corrected flat-field gratings. In contrast to conventional  gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire  detector in the focal plane of the grating for superior spectral resolution.

maxLIGHT pro

NO-SLIT FLAT-FIELD XUV SPECTROMETER AND BEAM PROFILER

Our maxLIGHT pro spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 200nm. Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm. The spectrometer can be used without entrance slit to maximize light collection for a range of source distances. Its modular design is able to match different experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

easyLIGHT spectrometer

 Compact VUV Spectrometer

Our easyLIGHT spectrometer provides aberration-corrected wavelength coverage in the vacuum ultraviolet spectral region. Based on a normal-incidence geometry, it offers spectrograph and monochromator functionality. The high-efficiency gratings can be rotated about their apexes by a high-accuracy positioning system, resulting in a wavelength selection accuracy at the exit slit of <0.1 nm. Entrance and exit slit widths can be set in the range of 0.01 to 4 mm by micrometer screws or a motorized actuator (optional).

Related UV Camera Options

Product
Model	maxCAM	easyCAM	XF95
Sensor	back-illuminated CCD from e2v (grade 1),  enhanced process, uncoated	front-illuminated CCD from e2v (grade 1),  enhanced process	Back-illuminated sCMOS without Anti-reflection coating
Wavelength	1-100nm( Best QE)	50-300nm	-
Pixels	1024 x 255 *		2048 x 2048
Pixel Size	26 x 26 um		11um x 11 um
Image Area	26.7 x 6.7 mm		22.5mm x 22.5mm
Spectral Rates	200/s full vertical bin, 1000/s crop mode		80-1000eV; 200 nm-1100nm
Minimum Temperature	-60° C air cooled		-50° C @20° C room temperature
Well Depth	500 000 e- active area,  1 000 000 eregister		90 000 e-
Read Noise	12.5 etyp. at 500kHz		1.6 e- (Median)
Dark Current	0.004 e- /px/s at -60°C		-
Linearity	>99%		-
Vacuum Compatibility	10-8mbar		10-7Pa(Max)

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