Extended X-ray Absorption EXAFS (5-12keV) | SIMTRUM Photonics Store

A complete lab-based solution for Extended X-ray Absorption Fine Structure (EXAFS) and X-ray 

Absorption Near Edge Structure (XANES) measurements.

In a compact footprint, it integrates x-ray tube source, high-resolution spectrometer, and hybrid 

detector together with a software suite to control instrument functions and analyze data. Spectra 

quality is on par with synchrotron measurements hence beamtime application is not required.

The x-ray tube source and spectrometer cover the energy range 5 to 12 keV, thus including the K 

absorption edges of 3d-transition metals. The optimized HAPG von Hamos architecture of the 

spectrometer yields an extremely high signal-to-noise ratio.This results in the analyte 

concentration being weighted lowly at few percentage.The instrument combines high efficiency 

with high spectral resolving power of up to E/ΔE = 4000, constant over the range of the covered 

absorption edges.

 Range of elements accessible to  hiXAS for EXAFS and XANES 

    measurements. 

 Even diluted samples with analyte concentrations of only a few 

    weight percent can be measured in a time frame of several

    minutes.

 Sample XAFS measurement of a 10um Cu foil, comparing lab-based (red) 

     and synchrotron (black) results.

 EXAFS oscillations (left) and corresponding Fourier transformation (right).

 Acquisition time: 3min with sample, 1.5min without sample.

 X-ray absorption spectrum of a 6um-thick Ni foil. Comparison 

    to the spectrum.

 Obtained at a synchrotron (NSLS, resolving power E/ΔE = 5000)

 Shows the high quality results of the tabletop instrument.

 All relevant spectral features are present, allowing for the 

   determination of chemical compounds