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Products / Light Analysis /Spectrometers /X-Ray/XUV/VUV Spectrometers (1-300nm) /VUV Spectrometers (80-300nm) /

VUV Spectrometers (80-300nm)

Overview maxLIGHT pro easyLIGHT Technical Advantage Related Product Order Now!

We can offer a variety of XUV/VUV spectrometers. Among them, the wavelength range of the XUV spectrometer covers 1-200nm. It adopts a no-slit design and features high light collection efficiency and system efficiency (efficiency can be increased by 20 times). The integrated beam profile analyzer makes it a complete characterization tool for XUV sources. The wavelength range of the VUV spectrometer covers 40-300nm. It adopts an aberration-corrected grating , which increases the grating utilization rate to 43%. Meanwhile, its closed-loop grating positioningprovides extremely high wavelength accuracy. Switching between the spectrometer and the monochromator can be achieved through inlet and outlet switching .

The modular design matches various experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as an electric grating positioning, which can be selected according to your specific experimental scenario. In addition, you can also choose to match various detectors, including XUV CCDS for high resolution and dynamic range, MCP/CMOS type detectors for wide wavelength coverage and gated/enhanced detection, and PMT detectors for scanning applications. Please contact us for further discussion of your requirements.The available models are as follows in the table.

maxLight spectrometer

highLight spectrometer

easyLight spectrometer

MaxLight pro

NO-SLIT FLAT-FIELD XUV SPECTROMETER AND BEAM PROFILER

Our maxLIGHT pro spectrometer features aberration-corrected flat-field wavelength coverage from 1nm to 200nm. Wide-band spectral measurements are possible by three gratings covering 1-20nm, 5-80nm, and 40-200nm. The spectrometer can be used without entrance slit to maximize light collection for a range of source distances. Its modular design is able to match different experimental geometries and configurations. It features an integrated slit holder and filter insertion unit, as well as a motorized grating positioning.

Direct Imaging of the Source

Images the source directly onto the detctor, does not require a narrow entrance aperture=
~20 times more light collection than standard versions,
resulting in a signal-to-noise figure improved by the same ratio
In some experiments, this improved signal strength is the crucial step for realizing a measurement at all

Rugged and Robost Design

Compact design, small footprint
Inherently insensitive against environmental disturbances and misalignment due to omission of entrance slit
No moving parts
Absolute grating position monitoring for maintaining grating alignment
Can be bolted directly to a vacuum chamber

Special Solutions

Non-magnetic instruments
Special housing geometries, in-chamber solutions
EMP-protection
UHV configurations

Customization

Every spectrometer is customized to exactly match the desired application
Interfacing to experimental chambers
Adaption of the source distance
Integration of customer-supplied detectors
User-defined filter mounts

Product Specification

Product Brochures English：maxLIGHT pro | easyLIGHT vuv

Model	Maxlight VUV
Wavelength Range	40- 200nm
Dispersion	0.9 - 1.6 nm/mm
Resolution	<0.05 nm @120nm
Topological structure	Aberration-corrected flat-field spectrometer
Distance of light source	Adjustable
Detector	CCD or MCP/CMOS
Vacuum condition	<10⁻⁶mbar (UHV Available)
Whether to support monochromator mode	No
Entrance slit	Optional
Grating position	Electric closed loop
Filter insertion unit	Optional
Control interface	USB / Ethernet
Software	Windows UI / Labview/VB/C/C++ SDK

Capture 1.PNG

Sample measurement demonstrating the improved signal strength. With the same signal strength, the resolution of maxLIGHT (solid lines) is significantly higher compared with a standard spectrometer(dotted lines). For equivalent resolution, standard technology would require a narrow slit setting and thus a significant degradation in signal strength. The proprietary no-slit technology delivers high resolution and signal strength at the same time. (data courtesy of Prof. C. Hauri, Paul Scherrer Inst.)

Sample measurement demonstrating the resolving power of maxLIGHT. The shown high harmonic spectrum is generated by the interaction of a single femtosecond laser pulse with a

solid target and subsequent spectral filtering. The substructure inherent to the generation process is clearly resolved by the XUV spectrometer. Plasma Phys. Control. Fusion 53 124021

(2011)

easyLIGHT spectrometer
Compact VUV Spectrometer

Our easyLIGHT spectrometer provides aberration-corrected wavelength coverage in the vacuum ultraviolet spectral region. Based on a normal-incidence geometry, it offers spectrograph and monochromator functionality. The high-efficiency gratings can be rotated about their apexes by a high-accuracy positioning system, resulting in a wavelength selection accuracy at the exit slit of <0.1 nm. Entrance and exit slit widths can be set in the range of 0.01 to 4 mm by micrometer screws or a motorized actuator (optional).

Versatility

• Spectrograph and monochromator in one device

• Slits continuously adjustable manually or motorized (optional)

• Compact and cost-effective

Special Solutions

• Non-magnetic instruments

• UHV configurations

• etc

Efficiency and Accuracy

• High accuracy wavelength selection by closed-loop micro-precision grating actuator

• Grating positioning controllable by software

• Highly efficient aberration-corrected grating

• Double stray light filter

Customization

• Every spectrometer is customized to exactly match the desired application, e.g:

• Interfacing to experimental chambers

• Adaption of the source distance

• Integration of customer-supplied detectors

• User-defined filter mounts

Product Specification

Product Brochures English：maxLIGHT pro | easyLIGHT vuv

Model	Easylight VUV	Easylight NA VUV
Wavelength Range	80- 300nm	120- 200nm
Dispersion	~2.5 nm/mm	~11 nm/mm
Resolution	<0.1 nm	<0.5 nm
Topological structure	Aberration-corrected flat-field spectrometer
Distance of light source	Adjustable	/
Detector	CCD or MCP/CMOS	Cooling MCP/CMOS
Vacuum condition	<10⁻⁶mbar (UHV Available)
Whether to support monochromator mode	Yes	Yes
Entrance slit	0~4 mm Continuously adjustable	0~3 mm Continuously adjustable
Grating position	Electric closed loop	1500 L/mm，Electric closed loop
Filter insertion unit	Optional
Control interface	USB / Ethernet
Software	Windows UI / Labview/VB/C/C++ SDK

Advantge of Slit-less Technology in VUV Spectrometer

Direct imaging of the source

In contrast to conventional devices the innovative XUV / VUV spectrometers by
HP do not require a narrow

entrance aperture but rather image the harmonic source directly onto the detector.
Thus 80% or more of the

incoming beam can be used for measurement. This configuration typically collects
15 to 25 times more light

than standard versions, resulting in a signal-to-noise figure improved by the same ratio.
In some experiments,

this improved signal strength is the crucial step for realizing a measurement at all.

Superior signal strength

The amount of light collected by the spectrometer is the key factor influencing its overall sensitivity and ultimately the most important feature required to obtain high

quality data even from weak sources. Conventional spectrometers use an entrance aperture (slit) at a fixed distance from the grating to create a small source which

is then dispersed and imaged onto the detector. In contrast to that the H+P spectrographs can be configured to directly image a radiation source positioned at any

distance from the grating onto the detector. In practice this allows for the collection of 15 to 25 times as much light from point-like radiation sources compared to a

conventional spectrometer with a 100µm entrance slit without degradation in spectral resolution.

Rugged design

The compact design of our XUV and VUV spectrometers makes them inherently insensitive against mechanical and environmental disturbances (vibrations, acoustics,

etc). No moving parts on the outside and closed-loop motors with absolute position monitoring inside the instrument add to the robustness and allow for monitoring of

the grating alignment at all times. The spectrometer can be bolted directly to a vacuum chamber and is capable of carrying its own weight. No table required. The

design also allows mounting in virtually any orientation.

Robust against misalignment

Owing to the rugged design even smaller bumps do not influence the instruments alignment. If the instrument is knocked heavily while the motor control is enabled, the

grating can be repositioned to the saved setting using the grating positioning motors. In addition the concept of a spectrometer without entrance slit also makes the

instrument less sensitive to misalignment. Under typical operating conditions a misalignment of the beam in the dispersion direction on the entrance of the spectrometer

by 500um would lead to a signal reduction by more than 20% in an instrument with entrance slit, while it is less than 10% for our design.

Flat-field imaging technology

All our spectrometers are based on high quality aberration-corrected flat-field gratings. In contrast to conventional

gratings these focus all wavelengths onto a plane rather than a circle. This allows for positioning the entire

detector in the focal plane of the grating for superior spectral resolution.

Related UV Camera Options

Product
Model	maxCAM	easyCAM	XF95
Sensor	back-illuminated CCD from e2v (grade 1), enhanced process, uncoated	front-illuminated CCD from e2v (grade 1), enhanced process	Back-illuminated sCMOS without Anti-reflection coating
Wavelength	1-100nm( Best QE)	50-300nm	-
Pixels	1024 x 255 *		2048 x 2048
Pixel Size	26 x 26 um		11um x 11 um
Image Area	26.7 x 6.7 mm		22.5mm x 22.5mm
Spectral Rates	200/s full vertical bin, 1000/s crop mode		80-1000eV; 200 nm-1100nm
Minimum Temperature	-60° C air cooled		-50° C @20° C room temperature
Well Depth	500 000 e- active area, 1 000 000 eregister		90 000 e-
Read Noise	12.5 etyp. at 500kHz		1.6 e- (Median)
Dark Current	0.004 e- /px/s at -60°C		-
Linearity	>99%		-
Vacuum Compatibility	10^-8mbar		10^-7Pa(Max)

Related Spectrometer Product

Product Model	Wavelength (nm)	Dispersion	Resolution
maxLIGHT Pro (XUV)	5 to 80	0.5 to 1.3nm/mm	<0.028nm at 40nm
easyLIGHT (XUV)	30 to 250	~2.0nm/mm	<0.1nm
highLIGHT(XUV)	1 to 100	-	<0.1nm
maxLIGHT (VUV)	40 to 200	0.9 to 1.6nm/mm	<0.05nm at 120nm
easyLIGHT (VUV)	80 to 300	~2.5nm/mm	<0.1nm
X-Ray Spectroscopy	2-4 keV		0.3eV
Extended X-ray Spectroscopy	5-12keV
Near Edge X-ray absorption	200 - 1200eV

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	Availability	Reference Price (USD)
easyLIGHT VUV Spectrometers Compact VUV Spectrometer	2-3 Weeks	Request for quote
maxLIGHT pro VUV Spectrometers No-slit Flat-field XUV Spectrometer and Beam Profiler, Wavelength coverage 1nm - 200nm Flat field size 35-70mm	2-3 Weeks	Request for quote
easyCAM FSI 1024x256 BSI CCD, Pixel 1024x256, Wavelength 50-300nm, Pixel size 26*26um	8-12 Weeks	Request for quote
maxCAM BSI 1024x512 BSI CCD, Pixel 1024x512, Wavelength 1-100nm, Pixel size 26*26um	8-12 Weeks	Request for quote
maxCAM BSI 1024x256 BSI CCD, Pixel 1024x256, Wavelength 1-100nm, Pixel size 26*26um	8-12 Weeks	Request for quote